New Cooperation in Egypt

TEEC is proud to announce a cooperation with our new partner:

Mr. Moustafa Elsayed from ELBA Group Limited in New Cairo - Egypt.


www.elba-ltd.com

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New Cooperation in Nigeria

TEEC is proud to announce a cooperation with our new partner:

Mr. Eke Azuka Stanley from Mease Energy Nig. Ltd. in Port Harcourt - Nigeria.


www.mease-energy.com

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New Research Studies

WAVE and Diffraction Tomography
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XII Simposio Bolivariano
September 26-28, 2016 in Bogota

TEEC gave a new presentation:
”Improved subsurface imaging by
application of structural CRS”
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ICE September 6-9, 2016 in Cancun

TEEC gave a new presentation:
“Advanced CRS application by model
based attribute guidance”
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Structural guided CRS

The structural CRS uses a geological 
model as a steering tool to determine
the CRS wavefield attributes more
precisely. The structural model is
derived from information such as
dipmeters at well location, surface
dips or geological backstripping.
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RTM depth model update

Common-Reflection-Point Gathers 
(CRP) from wave-based RTM well
reveal model accuracy where ray
based Kirchhoff CRP Gathers might
fail. We offer a velocity model
updating workflow based on RTM CRP
gathers and images.
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Mirror RTM & Mirror Kirchhoff PSDM

Marine OBS surveys with complex
geology such as salt tectonics are
now better imaged in depth by
application of Mirror RTM or Kirchhoff
PSDM. Due to the reciprocity each
OBS is considered as a shot and is
mirrored at the sea surface. That way
the subsurface is being imaged much
better as the shotcone is already fully
opened at seafloor.
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Full-Wavefield Migration

Instead of eliminating multiple energy
FWM technology uses multiples to
enhance depth imaging.

The added value of using multiples in
imaging will especially be important
for situations where primaries have
limited illumination:


Coarse source sampling in 3D

Shadow zones due to subsurface
complexities

VSP data with limited coverage
further away from well
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Diffraction Imaging

Specularity Gather offer the possibility to separate diffractions from reflections. Eliminating the reflected energy results into enhanced diffraction stacks
where features such as subtle fault
zones are investigated more precisely.
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Event calendar

Upcoming Exhibitions 2017
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SUGAR III

TEEC presented important new developments
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CRSplus regularisation of land data acquisition

CRS provides a new strategy to map land data
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Extended Diffraction
Imaging Technology

TEEC announces its first results using the new E.D.I.T method
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CRS RTM for 3D land data

Reverse Time Migration for land data from real topography
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New release:

Common Offset (CO) CRS
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CRSplus

Announcement of the latest CRSplus
 technology

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